报告题目：FISim: A Full-System Emulation Framework for Fault Injection Attack
报告日期及时间：2017年5月18日9:00
报告地点：B403
报告人： Qiang Xu
报告人单位： the Chinese University of Hong Kong
报告人简介： Qiang Xu is an associate professor of Computer Science & Engineering at the Chinese University of Hong Kong. He leads the CUhk REliable laboratory (CURE Lab.), and his research interests include electronic design automation, fault-tolerant computing and trusted computing. Dr. Xu has published 100+ papers at referred journals and conference proceedings, and received two Best Paper Awards and five Best Paper Award Nominations. He is currently serving as an associate editor for IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems.
报告摘要： Faults occurred on silicon pose great threat to the reliability and security of electronic systems, and this problem is exacerbated with aggressive technology scaling. In this talk, I shall discuss our recent work on fault injection attacks for crypto devices and a novel full-system fault emulation framework to verify the security of electronic products, namely FISim.
邀请人： 唐明教授
